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References using none todisplay none with asp.net web,windows application USPS OneCode Solution Barcode Kautz, W.H. (1967 none none ).

Testing for faults in combinational cellular logic arrays. In Proc. 8th Annual Symp.

on Switching & Automata Theory, pp. 161 174. McCluskey, E.

J. and Bozorgui-Nesbat, S. (1981).

Design for autonomous test. IEEE Trans. on Computers, C-30 (11), pp.

866 875. McCluskey, E.J.

(1984). Veri cation testing a pseudoexhaustive test technique. IEEE Trans.

on Computers, C-33 (6), pp. 541 546. Menon, P.

R. and Friedman, A.D.

(1971). Fault detection in iterative logic arrays. IEEE Trans.

on Computers, C-20 (5), pp. 524 535. Min, Y.

and Li, Z. (1986). Pseudoexhaustive testing strategy for large combinational circuits.

Computer System Science & Engg., 1 (4), pp. 213 220.

Parthasarthy, R. and Reddy, S.M.

(1981). A testable design of iterative logic arrays. IEEE Trans.

on Computers, C-30 (11), pp. 833 841. Patashnik, O.

(1983). Circuit Segmentation for Pseudoexhaustive Testing. Center for Reliable Computing Tech.

Report No. 83-14, Stanford University. Pitchumani, V.

and Soman, S. (1986). An application of unate function theory to functional testing.

In Proc. Int. Symposium on Fault-Tolerant Computing, pp.

70 75. Reddy, S.M.

(1973). Complete test sets for logic functions. IEEE Trans.

on Computers, C-22 (11), pp. 1016 1020. Roberts, M.

W. and Lala, P.K.

(1984). An algorithm for the partitioning of logic circuits. IEE Proc.

, 131 (4), Pt. E, pp. 113 118.

Shen, J.P. and Ferguson, F.

J. (1984). The design of easily testable array multipliers.

IEEE Trans. on Computers, C-33 (6), pp. 554 560.

Shperling, I. and McCluskey, E.J.

(1987). Circuit segmentation for pseudoexhaustive testing via simulated annealing. In Proc.

Int. Test Conference, pp. 112 124.

Sridhar, T. and Hayes, J.P.

(1981a). A functional approach to testing bit-sliced microprocessors. IEEE Trans.

on Computers, C-30 (8), pp. 563 571. Sridhar, T.

and Hayes, J.P. (1981b).

Design of easily testable bit-sliced systems. IEEE Trans. on Computers, C-30 (11), pp.

842 854. Takach, A.R.

and Jha, N.K. (1991).

Easily testable gate-level and DCVS multipliers. IEEE Trans. on Computer-Aided Design, 10 (7), pp.

932 942. Udell Jr., J.

G. (1989). Pseudoexhaustive test and segmentation: formal de nitions and extended fault coverage results.

In Proc. Int. Symposium on Fault-Tolerant Computing, pp.

292 298. Wu, C.W.

and Capello, P.R. (1990).

Easily testable iterative logic arrays. IEEE Trans. on Computers, 39 (5), pp.

640 652.. Delay fault testing Delay fault testi none none ng exposes temporal defects in an integrated circuit. Even when a circuit performs its logic operations correctly, it may be too slow to propagate signals through certain paths or gates. In such cases, incorrect logic values may get latched at the circuit outputs.

In this chapter, we rst describe the basic concepts in delay fault testing, such as clocking schemes, testability classi cation, and delay fault coverage. Next, we present test generation and fault simulation methods for path, gate and segment delay faults in combinational as well as sequential circuits. We also cover test compaction and fault diagnosis methods for combinational circuits.

Under sequential test generation, we look at non-scan designs. Scan designs are addressed in 11. We then discuss some pitfalls that have been pointed out in delay fault testing, and some initial attempts to correct these problems.

Finally, we discuss some unconventional delay fault testing methods, which include waveform analysis and digital oscillation testing.. Introduction Delay fault (DF) none for none testing determines the operational correctness of a circuit at its speci ed speed. Even if the steady-state behavior of a circuit is correct, it may not be reached in the allotted time. DF testing exposes such circuit malfunctions.

In 2 (Section 2.2.6), we presented various DF models, testing for which can ensure that a circuit is free of DFs.

These fault models include the gate delay fault (GDF) model and the path delay fault (PDF) model. GDFs can themselves be divided into gross GDFs (G-GDFs) and small GDFs (S-GDFs). G-GDFs are also called transition faults (TFs).

We also presented the segment delay fault (SDF) model, which is intermediate to the GDF and PDF models. We classi ed the two-pattern tests (which consist of an initialization vector and a test vector) required for DFs into robust and non-robust. Robust tests were further divided into hazard-free robust and general robust.

A special type of non-robust test, called validatable non-robust, was also de ned. In this chapter, we will be targeting these different types of fault models and tests for combinational and sequential circuits..

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